The crystal structure was studied by means of X-ray diffraction,magnetic disaccommodation measurements were carry out with a computer aided system based on a LCR bridge.
用X射线衍射仪对粉末样品的结构进
,磁导率减落
用计算机辅助系统的阻抗自动仪(LCR电桥)来完成。
The crystal structure was studied by means of X-ray diffraction,magnetic disaccommodation measurements were carry out with a computer aided system based on a LCR bridge.
用X射线衍射仪对粉末样品的结构进,磁导率减落用计算机辅助系统的阻抗自动仪(LCR电桥)来完成。
For electrical properties of MOS capacitors, the C-V curves were obtained by LCR meter (HP4284A), and picoampere meter (HP4140B) was used to measure the J-V curves.
另外
电感电容电阻计仪(HP4284A)进C-V曲线；微安培计仪(HP4140B)进J-V曲线。
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