We describe a subfringe integration interferometry for which the phase information is evaluated only from one interferogram.
叙述了次条纹积分计量的原理,仅用一幅光载条纹图获取全部位相信息。
We describe a subfringe integration interferometry for which the phase information is evaluated only from one interferogram.
叙述了次条纹积分计量的原理,仅用一幅光载条纹图获取全部位相信息。
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