We describe a subfringe integration interferometry for which the phase information is evaluated only from one interferogram.
叙述次条纹积分干涉计的原理,仅用幅光载频干涉条纹图获取全部位相信息。
We describe a subfringe integration interferometry for which the phase information is evaluated only from one interferogram.
叙述次条纹积分干涉计的原理,仅用幅光载频干涉条纹图获取全部位相信息。
The principle and structure of laser shearography and electronic speckle interferometry were introduced.Speckle pattern was disposed and analysed.
摘要介绍的激光电子剪切散斑干涉成像系统的原理及结构组成,对散斑图像进行图像处理分析。
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