We describe a subfringe integration interferometry for which the phase information is evaluated only from one interferogram.
叙述了次条积分
计量的原理,仅用
幅光载频
条
图获取全部位相信息。
We describe a subfringe integration interferometry for which the phase information is evaluated only from one interferogram.
叙述了次条积分
计量的原理,仅用
幅光载频
条
图获取全部位相信息。
The principle and structure of laser shearography and electronic speckle interferometry were introduced.Speckle pattern was disposed and analysed.
摘要介绍了研制的激光电子剪成像系统的原理及结构组成,对
图像进行了图像处理分析。
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